Tremmel, Florian; Nagler, Oliver; Kutter, Christoph; Holmer, Rainer:
Mechanical Robustness Analysis of Semiconductors with a Single Needle Probe Card Using Acoustic Emissions
, NDT.net
. In: e-Journal of Nondestructive Testing (eJNDT),
29.
2024
, 10, 36th Conference of the European Working Group on Acoustic Emission, 18-20 September 2024, Potsdam, Germany (EWGAE 2024)
. - p. 1-10
Konferenzbeitrag / Conference Paper