Tremmel, Florian; Nagler, Oliver; Kutter, Christoph; Holmer, Rainer: Mechanical Robustness Analysis of Semiconductors with a Single Needle Probe Card Using Acoustic Emissions , NDT.net . In: e-Journal of Nondestructive Testing (eJNDT), 29. 2024 , 10, 36th Conference of the European Working Group on Acoustic Emission, 18-20 September 2024, Potsdam, Germany (EWGAE 2024) . - S. 1-10
Konferenzbeitrag / Conference Paper