Ammer, Michael; Cao, Yiqun; Rupp, Andreas; Sauter, Martin; Maurer, Linus: Bringing the SEED Approach to the Next Level: Generating IC Models for System ESD and Electrical Stress Simulation out of Design Data , IEEE . In: IEEE Transactions on Electromagnetic Compatibility, 62. 2020 , 1 . - S. 25-35
Zeitschriftenartikel / Journal Article