Ammer, Michael; Cao, Yiqun; Rupp, Andreas; Sauter, Martin; Maurer, Linus:
Bringing the SEED Approach to the Next Level: Generating IC Models for System ESD and Electrical Stress Simulation out of Design Data
, IEEE
. In: IEEE Transactions on Electromagnetic Compatibility,
62.
2020
, 1
. - S. 25-35
Zeitschriftenartikel / Journal Article