Karnehm, Dominic; Neve, Antje: Adaptive Compressing Electric Vehicle Battery Pack Measurements using Polynomial Coding . In: IEEE International Conference on Smart Mobility 2024,  2024 
Konferenzbeitrag / Conference Paper

Ammer, Michael; Esmark, Kai; Rupp, Andreas; zur Nieden, Friedrich; Cao, Yiqun; Sauter, Martin; Maurer, Linus: Advanced Behavior Modeling of ICs for System-ESD Simulation with Destruction Limits in SPICE  2017 
Konferenzbeitrag / Conference Paper

Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert: Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress . In: 2005 PhD Research in Microelectronics and Electronics,  2005 . - S. 213-216 
Konferenzbeitrag / Conference Paper

Morgenstern, Haiko; Groos, Gerhard; Schmidt, M.; Köhne, Heiko; John, Werner; Stecher, Matthias; Reichl, Herbert: Algorithmus zur automatischen Verifikation komplexer Mixed-Signal ICs gegenüber ESD-Belastungen , Berlin , VDE-Verlag . In: Fachbeiträge der 8. GMM / ITG-Diskussionssitzung Analog ’05 ,  2005 . - S. 171-175 
Konferenzbeitrag / Conference Paper

Englberger, Ferdinand; Latzel, Thomas; Sotiriadis, Prodromos: An Autonomous Robot for Embedded Systems and Robotics , Piscataway . In: 2018 12th European Workshop on Microelectronics Education (EWME),  2019 
Konferenzbeitrag / Conference Paper

Yang, Chun; Arizabaleta-Diez, Markel; Weitkemper, Petra; Pany, Thomas: An Experimental Analysis of Cyclic and Reference Signals of 4G LTE for TOA Estimation and Positioning in Mobile Fading Environments , IEEE . In: IEEE Aerospace and Electronic Systems Magazine,  37.  2022 , 9 . - S. 16-41 
Zeitschriftenartikel / Journal Article

Haslbeck, Matthias; Böttcher, Jörg; Braml, Thomas: An Uncertainty Model for Strain Gages Using Monte Carlo Methodology . In: Sensors,  23.  2023 , 21 . - S. 8965 
Zeitschriftenartikel / Journal Article

Agbo, Pheobe; Weitkemper, Petra: Analysis of Different MEC Offloading Scenarios with LEO Satellite in 5G Networks , Piscataway, NJ , IEEE . In: 2023 IEEE International Conference on Omni-layer Intelligent Systems (COINS),  2023 . - S. 1-6 
Konferenzbeitrag / Conference Paper

Sauter, Martin; Bertagnolli, Emmerich; Knapek, Erwin; Stemmer, Andreas; Fröschle, Barbara; Eisele, Ignaz; Klose, Helmut: Application of electron beam lithography for downscaling of SOI-Bipolar and BiCMOS . In: Microeletronic Engineering, . In: Micro- and Nano-Engineering 95,  30.  1996 , 1-4 . - S. 31-34 
Zeitschriftenartikel / Journal Article

Heer, Michael; Dubec, Viktor; Blaho, Matej; Bychikhin, Sergey; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Stecher, Matthias; Groos, Gerhard: Automated setup for thermal imaging and electrical degradation study of power DMOS devices . In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF),  2005 
Konferenzbeitrag / Conference Paper