Universität der Bundeswehr München: AtheneForschung
Logo
Benutzer: Gast  Login
Sortieren nach:
und:
zurückweiter

Karnehm, Dominic; Neve, Antje:
Adaptive Compressing Electric Vehicle Battery Pack Measurements using Polynomial Coding
. In: IEEE International Conference on Smart Mobility 2024,
2024

Konferenzbeitrag / Conference Paper
Ammer, Michael; Esmark, Kai; Rupp, Andreas; zur Nieden, Friedrich; Cao, Yiqun; Sauter, Martin; Maurer, Linus:
Advanced Behavior Modeling of ICs for System-ESD Simulation with Destruction Limits in SPICE
2017

Konferenzbeitrag / Conference Paper
Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert:
Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress
. In: 2005 PhD Research in Microelectronics and Electronics,
2005
. - S. 213-216

Konferenzbeitrag / Conference Paper
Morgenstern, Haiko; Groos, Gerhard; Schmidt, M.; Köhne, Heiko; John, Werner; Stecher, Matthias; Reichl, Herbert:
Algorithmus zur automatischen Verifikation komplexer Mixed-Signal ICs gegenüber ESD-Belastungen
, Berlin
, VDE-Verlag
. In: Fachbeiträge der 8. GMM / ITG-Diskussionssitzung Analog ’05 ,
2005
. - S. 171-175

Konferenzbeitrag / Conference Paper
Englberger, Ferdinand; Latzel, Thomas; Sotiriadis, Prodromos:
An Autonomous Robot for Embedded Systems and Robotics
, Piscataway
. In: 2018 12th European Workshop on Microelectronics Education (EWME),
2019

Konferenzbeitrag / Conference Paper
Yang, Chun; Arizabaleta-Diez, Markel; Weitkemper, Petra; Pany, Thomas:
An Experimental Analysis of Cyclic and Reference Signals of 4G LTE for TOA Estimation and Positioning in Mobile Fading Environments
, IEEE
. In: IEEE Aerospace and Electronic Systems Magazine,
37.
2022
, 9
. - S. 16-41

Zeitschriftenartikel / Journal Article
Haslbeck, Matthias; Böttcher, Jörg; Braml, Thomas:
An Uncertainty Model for Strain Gages Using Monte Carlo Methodology
. In: Sensors,
23.
2023
, 21
. - S. 8965

Zeitschriftenartikel / Journal Article
Agbo, Pheobe; Weitkemper, Petra:
Analysis of Different MEC Offloading Scenarios with LEO Satellite in 5G Networks
, Piscataway, NJ
, IEEE
. In: 2023 IEEE International Conference on Omni-layer Intelligent Systems (COINS),
2023
. - S. 1-6

Konferenzbeitrag / Conference Paper
Sauter, Martin; Bertagnolli, Emmerich; Knapek, Erwin; Stemmer, Andreas; Fröschle, Barbara; Eisele, Ignaz; Klose, Helmut:
Application of electron beam lithography for downscaling of SOI-Bipolar and BiCMOS
. In: Microeletronic Engineering,
. In: Micro- and Nano-Engineering 95,
30.
1996
, 1-4
. - S. 31-34

Zeitschriftenartikel / Journal Article
Heer, Michael; Dubec, Viktor; Blaho, Matej; Bychikhin, Sergey; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Stecher, Matthias; Groos, Gerhard:
Automated setup for thermal imaging and electrical degradation study of power DMOS devices
. In: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF),
2005

Konferenzbeitrag / Conference Paper
Sortieren nach:
und:
zurückweiter