Zhang, Chuanfang; Park, Sang-Hoon; Ronan, Oskar; Harvey, Andrew; Seral-Ascaso, Andrés; Lin, Zifeng; McEvoy, Niall; Boland, Conor; Berner, Nina; Duesberg, Georg; Rozier, Patrick; Coleman, Jonathan; Nicolosi, Valeria:
Enabling flexible heterostructures for Li‐ion battery anodes based on nanotube and liquid‐phase exfoliated 2D gallium chalcogenide nanosheet colloidal solutions
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Yao, Hao; Luo, Siwei; Düsberg, Georg Stefan; Qi, Xiang; Lu, Donglin; Yue, Chao; Zhong, Jiangxin:
Enhanced photoresponse of graphene oxide functionalised SnSe films
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2018
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Zeitschriftenartikel / Journal Article

Preitnacher, Jonathan; Ageev, Sergei; Hansch, Walter:
Enhancing photodetection efficiency of CMOS SiPMs using virtual guard rings in a standard 0.35 μm process
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2023
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Zeitschriftenartikel / Journal Article

Alsioufy, Adnan; Hirler, Alexander; Lehndorff, Thomas; Sulima, Torsten; Lochner, H.; Hansch, Walter:
Entwicklung einer Technologie-BlackBox für die strukturierte Technologiebewertung in Automotive Anwendungen
2017

Sonstiges / Other Publication

Preitnacher, Jonathan :
Entwicklung und Charakterisierung eines Silizium-Photomultipliers mit integrierter Elektronik für zeitkritische Applikationen
2024

Dissertation / Thesis

Simon, Stefan:
Entwicklung und Erprobung eines austrittsarbeitsbasierenden Kohlenmonoxidsensors für Brennstoffzellenanwendung
2015

Dissertation / Thesis

Hartwig, Oliver:
Evaluating the Synthesis and Processing of 2D Materials using Raman Spectroscopy and X-Ray Photoelectron Spectroscopy
2023

Dissertation / Thesis

Gebauer, Wolfgang; Engelmann, Eugen; Ganka, Thomas; Iskra, Peter; Loebner, Sabrina; Marquez Seco, A.; Wiest, Florian; Fojt, Reinhard; Hansch, Walter:
Evaluation of a reliable and cost-effective PDE measurement setup with short cycle time for SiPM production monitoring
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Hirler, Alexander; Biba, Josef; Alsioufy, Adnan; Lehndorff; Thomas; Sulima, Torsten; Lochner, Helmut; Abelein, Ulrich; Hansch, Walter:
Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability
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. In: Microelectronics Reliability,
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Zeitschriftenartikel / Journal Article

Löbner, Sabrina; Marquez Seco, A.; Wiest, Florian; Iskra, Peter; Engelmann, Eugen; Gebauer, Wolfgang; Ganka, Thomas; Fojt, Reinhard; Hansch, Walter:
Evaluation of the ratio of different optical crosstalk paths in SiPM
2017

Konferenzbeitrag / Conference Paper