Hirler, Airler; Alsioufy, Adnan; Biba, Josef; Lehndorff, Thomas; Lochner, Helmut; Simon, S; Sulima, Torsten; Thomas, W.; Hansch, Walter: Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability . In: Microelectronics Reliability, 2019 , 100-101
Zeitschriftenartikel / Journal Article