Angerer, H.; Ambacher, O.; Stutzmann, Martin; Metzger, T.; Hopler, R.; Born, E.; Bergmaier, Andreas; Dollinger, Günther:
Characterization of AlxGa1-xN films prepared by plasma-induced molecular-beam epitaxy on c-plane sapphire
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Konferenzbeitrag / Conference Paper

Van Amelrooij, Edward F.; Schut, Henk; Egger, Werner; Dickmann, Marcel; Hugenschmidt, Christoph; Mallée, Lloyd; Hanefeld, Ulf; McMillan, Duncan G. G.; Eijt, Stephan W. H.:
Characterization of Enzymatically Synthesized Titania Thin Films Using Positron Annihilation Spectroscopy Reveals Low-Cost Approach for Organic/Inorganic Photovoltaic Cells
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Osipowicz, A.; Härting, M.; Hempel, M.; Britton, David T.; Bauer-Kugelmann, Werner; Triftshäuser, Werner:
Characterization of RF-sputtered platinum films from industrial production plants using slow positrons
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Brauer, Gerhard; Anwand, Wolfgang; Grambole, Dieter; Egger, Werner; Sperr, Peter; Beinik, Igor; Wang, Lin; Teichert, Christian; Kuriplach, Jan; Lang, Jan; Zviagins, Sergei; Cizmar, Erik; Ling, Chi Chung; Hsu, Yuk Fan; Xi, Yan Yan; Chen, Xinyi; Djurisic, Aleksandra B.; Skorupa, Wolfgang:
Characterization of ZnO nanostructures
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Zeitschriftenartikel / Journal Article

Frühauf, Jens; Lindsay, Richard; Bergmaier, Andreas; Dollinger, Günther; Vandervorst, Wilfried; Maex, Karen; Koch, Frederick:
Characterization of the b and as pile-up at the si-sio2 interface
. In: Ultra Shallow Junctions,
2003

Konferenzbeitrag / Conference Paper

Brijs, Bert; Deleu, J.; Conard, Thierry; De Witte, H.; Vandervorst, Wilfried; Nakajima, Kaoru; Kimura, Kenji; Genchev, Ivan N.; Bergmaier, Andreas; Görgens, Lutz; Neumaier, Peter; Dollinger, Günther; Döbeli, Max:
Characterization of ultra thin oxynitrides
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Calloni, A.; Ferragut, R.; Dupasquier, Alfredo; von Känel, H.; Guiller, A.; Rutz, A.; Ravelli, Luca; Egger, Werner:
Characterization of vacancy-type defects in heteroepitaxial GaN grown by low-energy plasma-enhanced vapor phase epitaxy
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Schütze, Johannes; Hager, Christoph:
Charakterisierung von Siliziumphotomultipliern
, Neubiberg
2012

Sonstiges / Other Publication

Schmelmer, Oliver; Dollinger, Günther; Frey, C. M.; Bergmaier, Andreas; Karsch, Stefan:
Charge dependent energy loss of 60 MeV 58Niq+ ions in argon gas
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Frey, C. M.; Dollinger, Günther; Bergmaier, Andreas; Faestermann, Thomas; Maier-Komor, Paul:
Charge state dependence of the stopping power of 1 MeV/A 58Ni ions
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