Triftshäuser, Werner; Kögel, Gottfried; Sperr, Peter; Britton, David T.; Uhlmann, K.; Willutzki, Paul
Dokumenttyp:
Zeitschriftenartikel / Journal Article
Titel:
A scanning positron microscope for defect analysis in materials science
Zeitschrift:
Nuclear Instruments and Methods in Physics Research Section B
Jahrgang:
130
Heftnummer:
1-4
Jahr:
1997
Seiten von - bis:
264-269
Sprache:
Englisch
Abstract:
The realisation of a scanning positron microscope will be presented and discussed. A positron beam with a variable energy from 0.5 to 30 keV, with a spot diameter of 1 μm or below, can be scanned over an area of 0.6 × 0.6 mm2. This beam is formed after a double stage stochastic cooling (moderation) of positrons emitted from a radioactive isotope. In addition the positron beam will be pulsed in order to have a well-defined time base for positron lifetime measurements. In the system included is a conventional scanning electron microprobe for surface analysis. The design of the scanning positron microscope is dominated by the special demands of positron physics. «
The realisation of a scanning positron microscope will be presented and discussed. A positron beam with a variable energy from 0.5 to 30 keV, with a spot diameter of 1 μm or below, can be scanned over an area of 0.6 × 0.6 mm2. This beam is formed after a double stage stochastic cooling (moderation) of positrons emitted from a radioactive isotope. In addition the positron beam will be pulsed in order to have a well-defined time base for positron lifetime measurements. In the system included is a... »