@article{,
    author = {Uhlmann, K.; Britton, David T.; Kögel, Gottfried},
    title = {A new optical column for a scanning positron microscope},
    editor = {},
    booktitle = {},
    series = {},
    journal = {Measurement Science and Technology},
    address = {},
    publisher = {},
    edition = {},
    year = {1995},
    isbn = {},
    volume = {6},
    number =  {7},
    pages = {932-938},
    url = {http://iopscience.iop.org/article/10.1088/0957-0233/6/7/012/meta},
    doi = {10.1088/0957-0233/6/7/012},
    keywords = {},
    abstract = {An optical column for a scanning positron microprobe is described. A beam of variable energy from 1 to 30 keV and a spot diameter of 1 mu m, that can be scanned over an area of 0.6*0.6 mm2 is formed using electron optical elements that are already well known but rarely used in an optical column. The idea allows the construction of a sample chamber free of material and electric fields in a hemisphere above the sample with a radius of some 100 mm or more. The absence of diaphragms and the comfortable inner diameter of the lenses used makes it possible to work with a beam of comparatively large diameter and aperture. This is necessary because of the low intensity of the positron sources available, which makes a system with a very high transmission essential. Although the idea was created for a positron microprobe, other applications, such as with a retarding field analyser introduced into the sample chamber, are conceivable.},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Luft- und Raumfahrttechnik, LRT 2 - Institut für angewandte Physik und Messtechnik, Professur: Dollinger, Günther},
    
    
}