@article{,
    author = {Heer, Michael; Dubec, Viktor; Blaho, Matej; Bychikhin, Sergey; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Stecher, Matthias; Groos, Gerhard},
    title = {Automated setup for thermal imaging and electrical degradation study of power DMOS devices},
    editor = {},
    booktitle = {},
    series = {},
    journal = {Microelectronics Reliability},
    address = {},
    publisher = {},
    edition = {},
    year = {2005},
    isbn = {},
    volume = {45},
    number =  {9-11},
    pages = {1688-1693},
    url = {https://doi.org/10.1016/j.microrel.2005.07.082},
    doi = {10.1016/j.microrel.2005.07.082},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}