@article{,
    author = {Reggiani, Susanna; Gnani, Elena; Rudan, Massimo; Baccarani, Giogio; Bychikhin, Sergey; Kuzmík, Ján; Pogany, Dionýz; Gornik, Erich; Denison, Marie; Jensen, Nils; Groos, Gerhard; Stecher, Matthias},
    title = {A New Numerical and Experimental Analysis Tool for ESD Devices by Means of the Transient Interferometric Technique},
    editor = {},
    booktitle = {},
    series = {},
    journal = {IEEE Electron Device Letters},
    address = {},
    publisher = {},
    edition = {},
    year = {2005},
    isbn = {},
    volume = {26},
    number =  {12},
    pages = {916-918},
    url = {https://doi.org/10.1109/LED.2005.859685},
    doi = {10.1109/LED.2005.859685},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}