@article{,
    author = {Groos, Gerhard},
    title = {Characterisation method for chip card ESD events causing terminal failures},
    editor = {},
    booktitle = {},
    series = {},
    journal = {Microelectronics Reliability},
    address = {},
    publisher = {},
    edition = {},
    year = {2012},
    isbn = {},
    volume = {52},
    number =  {9-10},
    pages = {2005-2009},
    url = {https://doi.org/10.1016/j.microrel.2012.06.072},
    doi = {10.1016/j.microrel.2012.06.072},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}