@inproceedings{,
    author = {Dubec, Viktor; Bychikhin, Sergey; Pogany, Dionýz; Gornik, Erich; Groos, Gerhard; Stecher, Matthias},
    title = {Error analysis in phase extraction in a 2D holographic imaging of semiconductor devices},
    editor = {Jeong, Tung H.; Bjelkhagen, Hans I.},
    booktitle = {Practical Holography XVIII : Materials and Applications},
    series = {Proceedings SPIE},
    journal = {},
    address = {},
    publisher = {},
    edition = {},
    year = {2004},
    isbn = {},
    volume = {5290},
    number =  {},
    pages = {233-242},
    url = {https://doi.org/10.1117/12.526551},
    doi = {10.1117/12.526551},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}