@inproceedings{,
    author = {Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert},
    title = {Algorithm for the automatic verification of complex mixed-signal ICs regarding ESD-stress},
    editor = {},
    booktitle = {2005 PhD Research in Microelectronics and Electronics},
    series = {},
    journal = {},
    address = {},
    publisher = {},
    edition = {},
    year = {2005},
    isbn = {0-7803-9345-7},
    volume = {},
    number =  {},
    pages = {213-216},
    url = {https://doi.org/10.1109/RME.2005.1543042},
    doi = {10.1109/RME.2005.1543042},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}