@inproceedings{,
    author = {Morgenstern, Haiko; Groos, Gerhard; Köhne, Heiko; Stecher, Matthias; John, Werner; Reichl, Herbert},
    title = {Chip-Level Verification of Complex Mixed-Signal ICs regarding ESD-Stress},
    editor = {},
    booktitle = {5th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC COMPO)  : München, 28.-30.11. 2005},
    series = {},
    journal = {},
    address = {},
    publisher = {},
    edition = {},
    year = {2005},
    isbn = {},
    volume = {},
    number =  {},
    pages = {},
    url = {},
    doi = {},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}