@inproceedings{,
    author = {Rudan, Masssimo; Reggiani, Susanna; Gnani, Elena; Baccarani, Giorgio; Corvasce, Chiara; Barlini, Davide; Ciappa, Mauro; Fichtner, Wolfgang; Denison,  Marie; Jensen, Nils; Groos, Gerhard; Stecher, Matthias},
    title = {Experimental validation of a new analytical model for the position-dependent Hall voltage in semiconductor devices},
    editor = {},
    booktitle = {Proceedings of 35th European Solid-State Device Research Conference, 2005  : ESSDERC 2005},
    series = {},
    journal = {},
    address = {Piscataway},
    publisher = {IEEE},
    edition = {},
    year = {2005},
    isbn = {0-7803-9203-5},
    volume = {},
    number =  {},
    pages = {565-568},
    url = {https://doi.org/10.1109/ESSDER.2005.1546711},
    doi = {10.1109/ESSDER.2005.1546711},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}