@inproceedings{,
    author = {Groos, Gerhard},
    title = {Charakterisierung des Entladeverhaltens von Single- und Dual-Interface Chipkarten},
    editor = {},
    booktitle = {Tagungsband 12. ESD Forum 2011 : München 6./7.12.2011},
    series = {},
    journal = {},
    address = {},
    publisher = {},
    edition = {},
    year = {2011},
    isbn = {},
    volume = {},
    number =  {},
    pages = {53-58},
    url = {},
    doi = {},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}