@inproceedings{,
    author = {Groos, Gerhard},
    title = {Characterisation method for chip card ESD events causing terminal failures},
    editor = {},
    booktitle = {23rd European Symposium on Reliability of Electronic Devices, Failure Physics and Analysis (ESREF) 2012 : 1-5 October 2012: Cagliari, Italy},
    series = {},
    journal = {},
    address = {},
    publisher = {},
    edition = {},
    year = {2012},
    isbn = {},
    volume = {},
    number =  {},
    pages = {},
    url = {},
    doi = {},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}