@inproceedings{,
    author = {Helmut, Dennis; Wachutka, Gerhard K. M.; Groos, Gerhard},
    title = {ESD damage without failure, followed by EOS : A case study on automotive power ICs},
    editor = {},
    booktitle = {Zuverlässigkeit und Entwurf : 9. ITG/GMM/GI-Fachtagung, 18.-20. September 2017 in Cottbus},
    series = {ITG-Fachbericht},
    journal = {},
    address = {Berlin},
    publisher = {VDE Verlag GmbH},
    edition = {},
    year = {2017},
    isbn = {978-3-8007-4444-2},
    volume = {274},
    number =  {},
    pages = {},
    url = {},
    doi = {},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Groos, Gerhard},
    
    
}