@article{,
    author = {Sauter, Martin; Pieper, Klaus-Willi},
    title = {Direct temperature measurement of integrated microelectronic devices by thermally induced leakage currents},
    editor = {},
    booktitle = {},
    series = {},
    journal = {Microelectronics Reliability},
    address = {},
    publisher = {},
    edition = {},
    year = {2001},
    isbn = {},
    volume = {41},
    number =  {1},
    pages = {133-136},
    url = {https://doi.org/10.1016/S0026-2714(00)00221-3},
    doi = {10.1016/S0026-2714(00)00221-3},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Technische Informatik, ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik, Professur: Sauter, Martin},
    
    
}