@inproceedings{,
    author = {Hirler, Alexander; Alsioufy, Adnan; Biba, Josef; Lehndorff, T.; Lipp, D.; Lochner, Helmut; Siddabathula, M.; Simon, S.; Sulima, Torsten; Wiatr, Maciej; Hansch, Walter},
    title = {Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability},
    editor = {},
    booktitle = {2019 IEEE International Reliability Physics Symposium (IRPS)},
    series = {},
    journal = {},
    address = {},
    publisher = {},
    edition = {},
    year = {2019},
    isbn = {978-1-5386-9504-3 ; 978-1-5386-9505-0},
    volume = {},
    number =  {},
    pages = {},
    url = {https://doi.org/10.1109/IRPS.2019.8720536},
    doi = {10.1109/IRPS.2019.8720536},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Informationstechnik, EIT 2 - Institut für Physik, Professur: Hansch, Walter},
    
    
}