@article{,
    author = {Hirler, Airler; Alsioufy, Adnan; Biba, Josef; Lehndorff, Thomas; Lochner, Helmut; Simon, S; Sulima, Torsten; Thomas, W.; Hansch, Walter},
    title = {Effective and combined stressors from multi-dimensional mission profiles for semiconductor reliability},
    editor = {},
    booktitle = {},
    series = {},
    journal = {Microelectronics Reliability},
    address = {},
    publisher = {},
    edition = {},
    year = {2019},
    isbn = {},
    volume = {},
    number =  {100-101},
    pages = {},
    url = {https://doi.org/10.1016/j.microrel.2019.06.015},
    doi = {10.1016/j.microrel.2019.06.015},
    keywords = {Automotive electronics ; Mission profile ; Semiconductor reliability ; Interdependent stressors ; Effective stress},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Informationstechnik, EIT 2 - Institut für Physik, Professur: Hansch, Walter},
    
    
}