@article{,
    author = {Hirler, Alexander; Biba, Josef; Lipp, D.; Lochner, H.; Siddabathula, M.; Simon, S.; Sulima, Torsten; Wiatr, M.; Hansch, Walter},
    title = {Experimental Reliability Study of Cumulative Damage Models on State-of-the-Art Semiconductor Technologies for Step-Stress Tests and Misson Profile Stresses},
    editor = {},
    booktitle = {},
    series = {},
    journal = {Journal of Vacuum Science & Technology B},
    address = {},
    publisher = {},
    edition = {},
    year = {2020},
    isbn = {},
    volume = {38},
    number =  {6},
    pages = {064001},
    url = {https://doi.org/10.1116/6.0000504},
    doi = {10.1116/6.0000504},
    keywords = {},
    abstract = {},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Informationstechnik, EIT 2 - Institut für Physik, Professur: Hansch, Walter},
    
    
}