@article{,
    author = {Zhussupbekov, Kuanysh; Cullen, Conor P.; Zhussupbekova, Ainur; Shvets, Igor; Duesberg, Georg; McEvoy, Niall; Ó Coileáin, Cormac},
    title = {Electronic and structural characterisation of polycrystalline platinum disulfide thin films},
    editor = {},
    booktitle = {},
    series = {},
    journal = {RSC Advances},
    address = {},
    publisher = {},
    edition = {},
    year = {2020},
    isbn = {},
    volume = {2020},
    number =  {10},
    pages = {42001-42007},
    url = {https://doi.org/10.1039/D0RA07405E },
    doi = {10.1039/D0RA07405E},
    keywords = {},
    abstract = {We employ a combination of scanning tunnelling microscopy (STM) and scanning tunnelling spectroscopy (STS) to investigate the properties of layered PtS<sub>2</sub>, synthesised via thermally assisted conversion (TAC) of a metallic Pt thin film. STM measurements reveal the 1T crystal structure of PtS<sub>2</sub>, and the lattice constant is determined to be 3.58 ± 0.03 Å. STS allowed the electronic structure of individual PtS<sub>2</sub> crystallites to be directly probed and a bandgap of ∼1.03 eV was determined for a 3.8 nm thick flake at liquid nitrogen temperature. These findings substantially expand understanding of the atomic and electronic structure of PtS<sub>2</sub> and indicate that STM is a powerful tool capable of locally probing non-uniform polycrystalline films, such as those produced by TAC. Prior to STM/STS measurements the quality of synthesised TAC PtS<sub>2</sub> was analysed by X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. These results are of relevance to applications-focussed studies centred on PtS<sub>2</sub> and may inform future efforts to optimise the synthesis conditions for thin film PtS<sub>2</sub>.},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Informationstechnik, EIT 2 - Institut für Physik, Professur: Düsberg, Georg},
    
    
}