@inproceedings{,
    author = {Herdl, Florian; Kueddelsmann, Maximilian J.; Schels, Andreas; Bachmann, Michael; Edler, Simon; Wohlfartsstätter, Dominik; Düsberg, Felix; Prugger, Alexander; Dillig, Michael; Dams, Florian; Schreiner, Rupert; Ó Coileáin, Cormac; Zimmermann, Stefan; Pahlke, Andreas; Düsberg, Georg},
    title = {Characterization and Operation of Graphene-Oxide-Semiconductor Emitters at Atmospheric Pressure Levels},
    editor = {},
    booktitle = {2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)},
    series = {},
    journal = {},
    address = {Piscataway, NJ},
    publisher = {IEEE},
    edition = {},
    year = {2023},
    isbn = {979-8-3503-0143-4},
    volume = {},
    number =  {},
    pages = {14-16},
    url = {},
    doi = {10.1109/IVNC57695.2023.10188974},
    keywords = {Electron emitter ; carbon ; graphene-oxide-semiconductor ; atmospheric pressure ; chemical analytics},
    abstract = {In recent years Graphene-Oxide-Semiconductor (GOS)
electron emitters have attracted a lot of interest due to their
outstanding durability in modest vacuum conditions.
However, the performance at ambient pressure remains
largely unexplored. In this study GOS-emitters are
characterized in nitrogen and air at atmospheric pressure, and
compared with their vacuum characteristics. For this purpose,
lifetime and IV-characteristics measurements are shown.
Furthermore, the GOS-emitter was operated as an ionization
source for ion mobility spectrometry (IMS) at ambient
conditions.},
    note = {},
    institution = {Universität der Bundeswehr München, Fakultät für Elektrotechnik und Informationstechnik, EIT 2 - Institut für Physik, Professur: Düsberg, Georg},
    
    
}