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Document type:
Konferenzbeitrag / Conference Paper
Title:
Experimental extraction of impact-ionization coefficient at large operating temperatures
Title of conference publication:
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004
Conference title:
IEEE International Electron Devices Meeting (2004, San Francisco, CA)
Venue:
San Francisco, CA
Year of conference:
2004
Date of conference beginning:
13.12.2004
Date of conference ending:
15.12.2004
Place of publication:
Piscataway
Publisher:
IEEE
Year:
2004
Pages from - to:
407-410
Language:
Englisch
ISBN:
0-7803-8684-1
Department:
Fakultät für Elektrotechnik und Technische Informatik
Institute:
ETTI 1 - Institut für Physik, Elektrotechnik und Automatisierungstechnik
Chair:
Groos, Gerhard
Open Access yes or no?:
Nein / No
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